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Reliability Testing

CHiL strives to design-in Reliability during our product development. We do full qualification tests, including ESD, Elevated Temperature Stress Tests, and Wear-out Characterization, to name a few.

We work closely and rely on our Foundry partner for wafer-level reliability, our Assembly and Packaging partner for package-level reliability, and we employ Ongoing Reliability Testing (ORT) on all products. In all cases, we adhere to JESD22 standards and test methods.

 Product Qualification Testing Reports

Part Number Description Report
CHL8100CRT 4 Phase Intelligent Digital PWM Controller  CHL8100 Qual Report
CHL8500CRT Synchronous Buck MOSFET Driver  CHL8500 Qual Report
CHL8510CRT High Efficiency 6A Buck MOSFET Driver  In process
CHL8314CRT 4 Phase Digital PWM Controller with SMBus  CHL8500 Qual Report
CHL8316CRT 6 Phase Digital PWM Controller with SMBus  CHL8500 Qual Report
CHL8318CRT 8 Phase Digital PWM Controller with SMBus  CHL8500 Qual Report
NOTE: Access to the qualification testing reports above is available to registered users only